The Local Power of the CADF and CIPS Panel Unit Root Tests
推导了Pesaran（2007）提出的CADF和CIPS两种面板单位根检验的局部渐近势函数，这两种检验能处理截面相关，但此前其局部势性质未知。
Very little is known about the local power of second generation panel unit root tests that are robust to cross-section dependence. This article derives the local asymptotic power functions of the cross-section argumented Dickey–Fuller Cross-section Augmented Dickey-Fuller (CADF) and CIPS tests of Pesaran (2007), which are among the most popular tests around.