Lot Sizing to Reduce Capacity Utilization in a Production Process with Defective Items, Process Corrections, and Rework
研究在考虑过程偏移、检测、纠正和返工等缺陷特征的生产环境中，如何通过批量确定来减少关键资源的处理时间，从而降低资源拥堵，适用于半导体晶圆探测等场景。
This paper deals with the lot sizing problem in which the key features of imperfections in a production process are explicitly modelled. These features include: process shifting to out-of-control states, detection of the out-of-control shifts, corrective actions following the detections, and the fixed setup and variable processing times of reworks. The problem is motivated by the wafer probe operation in semiconductor manufacturing. The key objective that drives the lot sizing decision is to reduce the total processing time on a critical resource. Such an objective is aimed at reducing the congestion level at this resource.