屏蔽系统寿命数据的贝叶斯推断

Bayesian Inference for Masked System Lifetime Data

Journal of the Royal Statistical Society. Series C: Applied Statistics · 1995
被引 82
ABS 3

中文导读

提出一种贝叶斯方法，用于分析组件失效原因未知（屏蔽）的系统寿命数据，帮助工程师在信息不完整时推断系统可靠性。

Abstract

B. Reiser, I. Guttman, Dennis K. J. Lin, Frank M. Guess, John S. Usher, Bayesian Inference for Masked System Lifetime Data, Journal of the Royal Statistical Society. Series C (Applied Statistics), Vol. 44, No. 1 (1995), pp. 79-90

贝叶斯统计可靠性分析寿命数据应用统计
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