研发强度与有效税率:一项元回归分析

R&D INTENSITY AND THE EFFECTIVE TAX RATE: A META‐REGRESSION ANALYSIS

Journal of Economic Surveys · 2016
被引 33
人大 AABS 2

中文导读

通过元回归技术,定量综述了研发支出如何影响有效税率的实证文献,区分了税收会计效应和利润转移效应,发现三分之一研发效应源于税收会计效应,10%的利润转移效应可归因于研发税收抵免。

Abstract

Abstract We apply meta‐regression techniques to provide a quantitative review of the empirical literature on how research and development (R&D) expenses affect the effective tax rate (ETR). R&D expenses relate to a well‐accepted profit shifting channel, strategic placement of intellectual property within a multinational entity. Using a unique hand‐collected data set, we add a new perspective to the current base erosion and profit shifting (BEPS) state of research and debate, in three ways: First, observing that primary studies report mixed evidence on how R&D expenses affect ETR, we provide a consensus estimate for this effect. Second, we consider this effect in more detail by separating a tax accounting effect and a profit shifting effect, which to our knowledge has not yet been investigated. We detect that one‐third of the R&D effect on the ETR is due to the tax accounting effect and could be mitigated via book‐tax conformity. We further find that 10% of the profit shifting effect can be traced back to R&D tax credits. Third, our meta‐regression reveals factors that are possible sources of variation and bias in previous empirical studies.

研发强度有效税率利润转移元回归分析