Nonparametric Estimation of Component Lifetime Based on Masked System Life Test Data
研究了屏蔽数据模型，即系统失效时间和失效元件集合的数据，提出元件寿命分布的非参数估计量，并证明该估计量弱收敛于高斯过程。
SUMMARY In this paper we study the model of masked data sets, i.e. data sets consisting of failure times of a system and sets of failed components. Failing components can yield further failures. The initially failed component is unknown. Initial failures and later failures are indistinguishable. A nonparametric estimator of the component lifetime distribution is derived. We prove weak convergence of the estimator to a Gaussian process.