Optimal accelerated life test designs for Burr type XII distributions under periodic inspection and type I censoring
研究了在周期检测和I型删失下，针对Burr XII型分布设计最优加速寿命试验，优化低试验应力及分配比例，以最小化设计应力下对数平均寿命估计的渐近方差。
This article develops optimal accelerated life test designs for Burr Type XII distributions under periodic inspection and Type I censoring. It is assumed that the mean lifetime (the Burr XII scale parameter) is a log-linear function of stress and that the shape parameters are independent of stress. For given shape parameters, design stress and high test stress, the test design is optimized with respect to the low test stress and the proportion of test units allocated to the low stress. The optimality criterion is the asymptotic variance of the maximum-likelihood estimator of log mean life at the design stress with the use of equally spaced inspection times. Computational results for various values of the shape parameters show that this criterion is insensitive to the number of inspection times and to misspecification of imputed failure probabilities at the design and high test stresses. Procedures for planning an accelerated life test, including selection of sample size, are also discussed. It is shown that optimal designs previously obtained for exponential and Weibull distributions are similar to those obtained here for the appropriate special cases of the Burr XII distribution. Thus the Burr XII distribution is a useful and widely applicable family of reliability models for ALT design. © 1996 John Wiley & Sons, Inc.