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技术演进下的两阶段可靠性测试:贝叶斯分析

072011 (M10, B33) Two-stage reliability tests with technological evolution: a Bayesian analysis

Insurance Mathematics and Economics · 1995
被引 0
人大 BABS 3
可靠性工程贝叶斯统计计量经济学半导体技术