嵌入图框架中的图与双序列输入用于样本不足下复杂设备的高效异常检测

A graph embedded in graph framework with dual-sequence input for efficient anomaly detection of complex equipment under insufficient samples

• Haodong Yan
• Fudong Li
• Jinglong Chen 通讯
• Yong Feng
• Xinwei Zhang
• Zijun Liu