Ontology-guided attribute learning to accelerate certification for developing new printing processes
提出一种受人类学习启发的属性学习方法，利用工程本体提取缺陷类别嵌入，通过联合优化识别训练数据中未见过的新缺陷，在直写印刷案例中显著提升零样本和少样本学习效果。
Identifying printing defects is vital for process certification, especially with evolving printing technologies. However, this task proves challenging, especially for micro-level defects necessitating microscopy, which presents a scalability barrier for manufacturing. To address this challenge, we propose an attribute learning methodology inspired by human learning, which identifies shared attributes among seen and unseen objects. First, it extracts defect class embeddings from an engineering-guided defect ontology. Then, attribute learning identifies the combination of attributes for defect estimation. This approach enables it to recognize previously unseen defects by identifying shared attributes, even those not included in the training dataset. The research formulates a joint optimization problem for learning and fine-tuning class embedding and ontology and solves it by integrating natural language processing, metaheuristics for exploration and exploitation, and stochastic gradient descent. In a case study involving a direct-ink-writing process for creating nanocomposites, this methodology was used to learn new defects not found in the training data using the optimized ontology. Compared to traditional zero-shot learning, this ontology-based approach significantly improves class embedding, outperforming transfer learning in one-shot and two-shot learning scenarios. This research represents an early effort to learn new defect concepts, potentially reducing the need for extensive measurements in defect identification.