Quantum Few-Shot Image Classification
提出一种量子小样本图像分类方法，用量子态局部相位增强数据表示，并用参数化量子电路构建分类模型，在三个数据集上以更少计算资源超越经典方法。
Few-shot learning algorithms frequently exhibit suboptimal performance due to the limited availability of labeled data. This article presents a novel quantum few-shot image classification methodology aimed at enhancing the efficacy of few-shot learning algorithms at both the data and parameter levels. Initially, a quantum augmentation image representation technique is introduced, leveraging the local phase of quantum states to support few-shot learning algorithms at the data level. This approach enriches classical data while maintaining its intrinsic physical properties. Subsequently, a parameterized quantum circuit is employed to construct the classification model. This circuit, characterized by a reduced number of trainable parameters, shows increased resilience to overfitting, thereby offering a significant advantage at the parameter level for few-shot learning algorithms. The proposed approach is validated using three datasets, with experimental results indicating that it outperforms classical methods in few-shot learning scenarios while requiring fewer computational resources.