基于GRU相似性迁移网络驱动的线性多分数Lévy稳定运动预测MOSFET剩余使用寿命的新方法
A novel method for predicting the remaining useful life of MOSFETs based on a linear multi-fractional Lévy stable motion driven by a GRU similarity transfer network
Reliability Engineering and System Safety · 2025
被引 8
ABS 3
- Shuai Lv
- Shujie Liu 通讯
- Hongkun Li
- Yu Wang
- Gengshuo Liu
- Weihui Dai
电子工程可靠性工程机器学习故障预测与健康管理