Intelligent Inspection of Electronic Devices in Specific Environments via a Novel Cascade Network of Combining Mixed Sampling and Nonstrided Convolution
针对电子设备检测中误报率高、低分辨率及多视角问题，提出一种级联检测框架，通过混合区域采样和无步长下采样方法提升检测性能，在自建数据集上mAP提升4.48%。
In environments where intelligent video surveillance systems (IVSSs) are deployed, particularly in review room, the detection of electronic devices constitutes a crucial task. Nevertheless, this task presents significant challenges attributed to the high rates of false positives and false negatives in electronic device detection (EDD), compounded by the low resolution of objects when viewed from multiple angles.To address these challenges, we propose a deep learning-based cascaded detection framework. Specifically, we design a mixed region sampling (MRS) method to enhance the foreground perception with background information and image details. We design a nonstrided downsampling method (ASDP) to map the attention spatial features to depth and improve the detection of low-resolution objects with fine-grained features. We enhance the model’s robustness to different viewing angles by feature perturbation during training. Moreover, we use a cascaded strategy to reduce false positives. To evaluate our method, we construct a real review room dataset (EDD) with 28,000 images from multiple angles. Our method improves the multiview generalization performance by 4.48% mAP and 5.62% mAR. On the public datasets Pascal VOC-2007 and visDrone-2019, our method is also superior to other suboptimal methods. We propose a framework for review environment detection, which is accurate, fast, and generalizable to other scenarios.