小样本电迁移测试中BGA试样的退化过程建模与数据驱动寿命预测

Degradation process modeling and data-driven lifetime prediction for BGA specimen during small sample electromigration test

• Peixuan Li
• Meilin Wen
• Waichon Lio 通讯
• Yingxia Liu
• Rui Kang