基于具有相依退化率和波动性的广义偏斜维纳过程的退化分析
Degradation analysis based on a generalized skew-Wiener process with dependent degradation rate and volatility
Reliability Engineering and System Safety · 2026
被引 1
ABS 3
- Jiale Du
- Junjie Yu
- Songhua Hao 通讯
退化建模可靠性分析随机过程半导体可靠性